File information: | |
File name: | hfe_harman_kardon_dpr1001_service.pdf [preview hfe harman kardon dpr1001 service] |
Size: | 14184 kB |
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Mfg: | DENON |
Model: | hfe harman kardon dpr1001 service 🔎 |
Original: | hfe harman kardon dpr1001 service 🔎 |
Descr: | DENON Audio DPR1001 hfe_harman_kardon_dpr1001_service.pdf |
Group: | Electronics > Consumer electronics > Audio |
Uploaded: | 04-03-2020 |
User: | Anonymous |
Multipart: | No multipart |
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Decompress result: | OK | |
Extracted files: | 1 | |
File name hfe_harman_kardon_dpr1001_service.pdf harman/kardon DPR1001 DIGITAL PATH AUDIO/VIDEO RECEIVER SERVICE MANUAL CONTENTS ELECTROSTATICALLY SENSITIVE DEVICES...2 EXPLODED VIEW PARTS LIST...23 LEAKAGE TESTING...3 BLOCK DIAGRAM...24 SPECIFICATIONS...4 TECHNOLOGY OVERVIEW...25 DETAILED SPECIFICATIONS...5 POWER SUPPLY (SMPS)...39 FRONT PANEL CONTROLS...14 TUNER SCHEMATICS/SPECS...47 FRONT PANEL CONNECTIONS...15 PCB DRAWINGS...52 REAR PANEL CONTROLS...16 MECHANICAL PARTS LIST...72 REAR PANEL CONNECTIONS...17 ELECTRICAL PARTS LIST... ...74 MAIN REMOTE CONTROL FUNCTIONS...18 SEMICONDUCTOR DATA...107 TROUBLESHOOTING GUIDE...21 SCHEMATICS... ...143 PROCESSOR RESET...21 WIRING DIAGRAM... ...164 UNIT EXPLODED VIEW...22 PACKAGING...165 harman/kardon, Inc. 250 Crossways Park Dr. Woodbury, New York 11797 Rev1 1/2006 DPR1001 harman/kardon ELECTROSTATICALLY SENSITIVE (ES) DEVICES Some semiconductor (solid state) devices can be damaged easily by static electricity. Such components commonly are called Electrostatically Sensitive (ES) Devices. Examples of typical ES devices are integrated circuits and some field effect transistors and semiconductor "chip" components. The following techniques should be used to help reduce the incidence of component damage caused by static electricity. 1. Immediately before handling any semiconductor component or semiconductor-equipped assembly, drain off any electrostatic charge on your body by touching a known earth ground. Alternatively, obtain and wear a commercially available discharging wrist strap device, which should be removed for potential shock reasons prior to applying power to the unit under test. 2. After removing an electrical assembly equipped with ES devices, |
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